Atomic Force Microscopy (AFM) and Scanning Tunneling Microscopy (STM) are two very efficient techniques for examining materials at the atomic and molecular levels. AFM works on the interaction forces between the tip and the sample surface. STM is a sort of microscopy that scans the surface of a sample using a conductive tip. While AFM and STM have certain commonalities, they also have some substantial differences. Read this article to find out more about AFM and STM and how they are different from each other. What is AFM? AFM works on the interaction forces between the tip and the sample ... Read More